Control your farm with metrics and analytics

Gros.farm brings metrics, history, tech card norms, and events into one interface. You see current values, open charts, and find the causes of deviations faster.

All key metrics in one place

45+ metrics are collected as working farm data. You see the value, unit, update time, and source.

Current value

See the actual state of a site or crop right away.

Data source

Understand where the value came from and when it was updated.

Quick chart

Open the metric history without moving into a complex report.

Manual input

Add measurements manually when a sensor is not connected yet.

Gros.farm screenshot with manual metric input, metric cards, and a chart

Metric types in Gros.farm

Manual input

Enter a measurement on the site yourself or assign it to an employee with the right role.

Sensors

Connect multiple sources and measurement points for one metric.

Weather services

Add weather, light, and external condition data to your metrics.

Formulas

Get VPD, DPD, radiation sum, and other values from data already collected.

Metrics are compared with tech card norms

The norm depends on the crop, cultivation stage, day, and night. On the chart, you see not only the value, but also how it fits the current technology corridor.

  • see current norms for each stage;
  • notice exits from the target corridor faster;
  • understand why climate, light, and irrigation requirements change.
Gros.farm metric chart with the target corridor from a tech card

Compare data over a period

In analytics, choose a site and crop, set a period of 12, 24, 72 hours, 7 days, or a custom range. Then select the connected metrics you want to see on the chart.

Metrics

Only the metrics needed for analysis are enabled.

Periods

View 12 hours, 24 hours, 72 hours, 7 days, or a custom range.

Statistics

Get the minimum, maximum, and average for the selected period.

History

Zoom into the chart to examine specific parts of the history.

Event on a Gros.farm analytics chart

Events explain changes on the chart

See stage changes, setpoint changes, completed tasks, or manual actions next to the chart. This makes it easier to understand why the data changed and what happened on the site.

Less guesswork,
more control

Owner

See trends and deviations across sites without collecting reports manually.

Agronomist

Compare the actual mode with tech card norms and find the cause faster.

Expert

Open the same data as the team, without retellings or scattered screenshots.

Team

Work from one fact base: metrics, events, tasks, and norms in a shared context.

Frequently asked questions

Can I track farm metrics without connected sensors?

Yes. You can collect metrics through manual input, and weather service data is available right away after you enable it in settings. Later, you can connect additional sensors and expand the set of automatic measurements.

How are metrics compared with tech card norms?

Norms come from the tech card and depend on the crop, cultivation stage, day, and night. On the chart, you see the actual value and the technology corridor, so deviations are easier to notice.

How do I understand why a metric went outside the norm?

Look at the events next to the chart: stage changes, setpoint changes, completed tasks, or manual actions. This helps connect data changes with what happened on the site.

Which metrics can be analyzed in Gros.farm?

Gros.farm includes 45+ metrics: climate, light, humidity, CO2, air and substrate temperature, weather data, and calculated metrics such as VPD, DPD, and radiation sum.

Can I compare several metrics over one period?

Yes. In analytics, choose a site, crop, and period of 12, 24, 72 hours, 7 days, or a custom range, then select the metrics that should appear on one chart.

How do I know where a metric value came from?

The metric card shows the value, unit, update time, and data source. This helps you understand whether the value came from manual input, a sensor, a weather service, or a calculation.

Start tracking farm metrics in Gros.farm

Metrics, analytics, tech card norms, and events in one working process